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MOESM1 of Investigation of hole-free phase plate performance in transmission electron microscopy under different operation conditions by experiments and simulations

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posted on 2019-10-02, 04:20 authored by Rebecca Pretzsch, Manuel Dries, Simon Hettler, Martin Spiecker, Martin Obermair, Dagmar Gerthsen
Additional file 1: Video S1. Movie of a CNT sample acquired with an HFPP under case A operation conditions (positive phase shift) showing contrast inversions due to rapid contamination growth at the position of the intense ZOB on the HFPP film. Scale bar corresponds to 100 nm.

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    Transmission electron microscopyPhase contrast imagingPhase plateThin filmHole-free phase plateVolta phase platePhase shift profileCarbon nanotubes

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